DocumentCode
1916468
Title
High performance, high yield millimeter-wave MMIC LNAs using InP HEMTs
Author
Tran, L. ; Isobe, R. ; Delaney, M. ; Rhodes, R. ; Jang, Daeung ; Brown, J. ; Nguyen, L. ; Le, M. ; Thompson, M. ; Liu, T.
Author_Institution
Hughes Space & Commun. Co., El Segundo, CA, USA
fYear
1996
fDate
17-19 June 1996
Firstpage
133
Lastpage
136
Abstract
A millimeter-wave MMIC low noise amplifier chip set has been developed. Based on the InP HEMT technology, these LNAs provide state-of-the-art performance as well as excellent yield and repeatability. With greater than 50% chip yield, a three-stage Q-band LNA design achieved 26 to 31 dB of gain from 42 to 50 GHz and 1.8 dB average noise figure from 43.3 to 45.7 GHz. In addition, there are six other LNA designs including a four-stage V-band LNA with 28 dB of gain and 2.3 dB noise figure and a two-stage balanced Q-band LNA that provided 17 dB of gain and has greater than 61% yield.
Keywords
HEMT integrated circuits; III-V semiconductors; differential amplifiers; field effect MIMIC; indium compounds; integrated circuit noise; integrated circuit reliability; integrated circuit yield; millimetre wave amplifiers; satellite communication; 1.8 dB; 17 dB; 2.3 dB; 26 to 31 dB; 28 dB; 42 to 50 GHz; 43.3 to 45.7 GHz; HEMTs; InP; LNAs; Q-band; V-band; average noise figure; low noise amplifier; millimeter-wave MMIC; repeatability; two-stage balanced circuit; yield; Circuit testing; HEMTs; Indium phosphide; Laboratories; MMICs; MODFETs; Millimeter wave communication; Millimeter wave technology; Noise figure; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Millimeter-Wave Monolithic Circuits Symposium, 1996. Digest of Papers., IEEE 1996
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-3360-8
Type
conf
DOI
10.1109/MCS.1996.506320
Filename
506320
Link To Document