DocumentCode

1916833

Title

Present Understanding of Gate Oxide Wearout

Author

Rosenbaum, Elyse ; Wu, Jie

Author_Institution

University of Illinois at Urbana-Champaign, USA

fYear

2000

fDate

11-13 September 2000

Firstpage

54

Lastpage

59

Keywords

Anodes; Breakdown voltage; Cathodes; Charge carrier processes; Electric breakdown; Electron traps; Lead compounds; Leakage current; Testing; Tunneling;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 2000. Proceeding of the 30th European

Print_ISBN

2-86332-248-6

Type

conf

DOI

10.1109/ESSDERC.2000.194717

Filename

1503647