• DocumentCode
    1918219
  • Title

    MUCH - A MOS-Like Switch for Smart Power

  • Author

    Tiensuu, Stefan ; Söderbärg, Anders ; Svedberg, Per

  • Author_Institution
    Uppsala University, Dept. of Technology, Box 534, S-751 21 Uppsala, Sweden
  • fYear
    1994
  • fDate
    11-15 Sept. 1994
  • Firstpage
    225
  • Lastpage
    228
  • Abstract
    A novel mutual channel (MUCH) device for switching high voltage on a small chip area is presented. The device layout is composed of two interacting MOS-transistors. The two transistors are stacked on each other and separated by a shared gate oxide. By this concept idea, a mutual channel device with beneficial high voltage behaviour and without any ordinary drift region can be designed. Simulation results show that, for the same breakdown voltage and on-resistance, 3-9 times smaller chip area is needed for the proposed concept compared to a transistor made in ordinary LDMOS technique. Experimentally, the voltage breakdown for a 30 ¿m long n-channel and a 10 ¿m long p-channel, separated wit 490 Å thick gate oxide, is measured to 180 V. The on-resistance for the same device is about 1.5 k¿/sq.
  • Keywords
    Avalanche breakdown; Computer simulation; Dielectric breakdown; Leakage current; Low voltage; Semiconductor device measurement; Silicon; Switches; Thickness measurement; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1994. ESSDERC '94. 24th European
  • Conference_Location
    Edinburgh, Scotland
  • Print_ISBN
    0863321579
  • Type

    conf

  • Filename
    5435707