• DocumentCode
    1919260
  • Title

    Multicriterial approach correlation of the solder joints functional tests results

  • Author

    Plotog, I. ; Cucu, T. ; Mihailescu, Bogdan ; Varzaru, G. ; Svasta, P. ; Bunea, R. ; Busu, I.

  • Author_Institution
    Center for Technol. Electron. & Interconnection Tech., Politeh. Univ. of Bucharest, Bucharest, Romania
  • fYear
    2010
  • fDate
    11-12 Nov. 2010
  • Firstpage
    429
  • Lastpage
    432
  • Abstract
    The assembling of the electronic components on PCBs becomes a key issue in electronic packaging reliability. The solder joints resulting from the soldering process represent an important outcome for the PCB assembling. Moreover, the Lead-Free soldering requests, imposed by the RoHS Directive, can cause difficulties in obtaining a high quality/reliable soldering process. Considering the reliability of electronic modules as expression of solder joints functionality, could be emphasized the lack of tests over solder joints functionality on assembling line. Usually are realized optical inspections and, in precise situation, X-Ray analysis are done over assembled PCBs being followed by “in circuit” electrical functional tests. The defects type “hide” or “cold/dry joints” could be not found. In the paper are presented the results of the functional tests of solder joints realized in two soldering technology, infrared-convection and vapor phase. Regarding to thermal functionality, infrared analysis of temperature distribution on the surface of a populated PCBs using thermovision were done. A correlation among functionality, reliability and thermovision functional analysis will be realized based on the experiments results. In consequence, the authors emphasize thermovision as available in circuit indirect test method for “hide” defects of solder joints.
  • Keywords
    assembling; circuit reliability; electronics packaging; functional analysis; printed circuit testing; printed circuits; soldering; temperature distribution; PCB assembling; electronic components; electronic packaging reliability; hide defect; in circuit electrical functional test; infrared analysis; infrared-convection soldering; multicriterial approach correlation; solder joint functional test; temperature distribution; thermovision functional analysis; vapor phase soldering; Heating; Soldering; solder joints functionality; thermovision; vapor phase;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics and Telecommunications (ISETC), 2010 9th International Symposium on
  • Conference_Location
    Timisoara
  • Print_ISBN
    978-1-4244-8457-7
  • Type

    conf

  • DOI
    10.1109/ISETC.2010.5679337
  • Filename
    5679337