DocumentCode
1919556
Title
P2–19: A scheme of uniformity measuring for flat plane cold cathode
Author
Qin, L. ; Deng, S.Z. ; Xu, N.S. ; Chen, Jun
Author_Institution
State Key Lab. of Optoelectron. Mater. & Technol., Sun Yat-sen Univ., Guangzhou, China
fYear
2010
fDate
26-30 July 2010
Firstpage
159
Lastpage
160
Abstract
A luminance-based method was proposed for the emission uniformity characterization of the flat plane cold cathode. A research of relating to new parameters redefining, testing and evaluating was introduced. A comparison was also taken in this paper with the current method.
Keywords
brightness; cold-cathode tubes; emission uniformity characterization; flat plane cold cathode; luminance-based method; parameter redefining; parameter testing; uniformity measuring; Area measurement; Cathodes; Electron emission; Light sources; Materials; Pixel; Zinc oxide; Field emission uniformity; Flat plane cold cathode; Luminance-based method;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference (IVNC), 2010 23rd International
Conference_Location
Palo Alto, CA
Print_ISBN
978-1-4244-7889-7
Electronic_ISBN
978-1-4244-7888-0
Type
conf
DOI
10.1109/IVNC.2010.5563149
Filename
5563149
Link To Document