Understanding nMOSFET Characteristics after Soft Breakdown and Their Dependence on the Breakdown Location

Author

Kaczer, B. ; Degraeve, R. ; Crupi, F. ; Keersgieter, A. De ; Groeseneken, G.

Author_Institution

IMEC, Leuven, Belgium

fYear

2002

fDate

24-26 September 2002

Firstpage

139

Lastpage

142

Keywords

Electric breakdown; Electrons; Equations; FETs; Immune system; Insulation; MOSFET circuits; Medical simulation; Medical tests; Stress;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 2002. Proceeding of the 32nd European

Print_ISBN

88-900847-8-2

Type

DOI

10.1109/ESSDERC.2002.194889

Filename

1503819

Link To Document