• DocumentCode
    1922626
  • Title

    Performance and Reliability of High Density Flash EEPROMs under CHISEL Programming Operation

  • Author

    Mahapatra, S. ; Shukuri, S. ; Bude, J.

  • Author_Institution
    EE Dept, IIT Bombay, India
  • fYear
    2002
  • fDate
    24-26 September 2002
  • Firstpage
    351
  • Lastpage
    354
  • Keywords
    Automatic testing; Channel hot electron injection; Character generation; Degradation; EPROM; Impact ionization; Integrated circuit reliability; Integrated circuit technology; Threshold voltage; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
  • Print_ISBN
    88-900847-8-2
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2002.194941
  • Filename
    1503871
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1922626