DocumentCode
1924562
Title
Electromigration Failure in Thin Film Conductors a perspective
Author
Lloyd, J.R.
Author_Institution
Lloyd and Thompson Associates, Inc., PO Box 194, Stow MA 01775-0194
fYear
1996
fDate
9-11 Sept. 1996
Firstpage
839
Lastpage
846
Keywords
Conductive films; Current density; Electromigration; Electrons; Equations; Metals industry; Solid state circuits; Thin film circuits; Thin film transistors; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1996. ESSDERC '96. Proceedings of the 26th European
Conference_Location
Bologna, Italy
Print_ISBN
286332196X
Type
conf
Filename
5435971
Link To Document