DocumentCode
1927227
Title
Microwave on-wafer characterization of three-port devices using shield-based test-fixtures
Author
Kulding, T.E. ; Jenner, M.B. ; Laursen, S.
Author_Institution
RISC, Aalborg Univ., Denmark
Volume
3
fYear
2001
fDate
20-24 May 2001
Firstpage
1535
Abstract
The capability of shield-based test-fixture design used in conjunction with three-port device measurements is demonstrated. The reduction of forward coupling and common-ground parasitics facilitates simple de-embedding that can easily be applied to multi-port measurements. The procedure is detailed and the capability of the method is demonstrated with gigahertz device measurements.
Keywords
electromagnetic shielding; microwave measurement; multiport networks; common-ground parasitics; de-embedding; forward coupling; gigahertz device; microwave on-wafer measurement; shield-based test fixture; three-port device; Circuit testing; Coupling circuits; Impedance measurement; Integrated circuit measurements; Integrated circuit modeling; Measurement standards; Microwave devices; Radio frequency; Radiofrequency integrated circuits; Scattering parameters;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2001 IEEE MTT-S International
Conference_Location
Phoenix, AZ, USA
ISSN
0149-645X
Print_ISBN
0-7803-6538-0
Type
conf
DOI
10.1109/MWSYM.2001.967195
Filename
967195
Link To Document