2005 Spanish Conference on Electron Devices. Proceedings (IEEE Cat. No.05EX965)

fYear

2005

fDate

2-4 Feb. 2005

Abstract

The following topics are dealt with: plastic microelectronics; thin film transistors; photodetectors; organic electronic devices; automotive electronics; carbon nanotubes; molecular electronics; electron device characterization and reliability; power devices; RF and microwave devices; bioelectronic devices; quantum devices; organic devices; nanotechnology; photovoltaic devices; optoelectronic and photonic devices; semiconductor device modeling and simulation; thermal annealing; DRIE; focused ion beam technology; MEMS and sensors and actuators.

Keywords

actuators; annealing; automotive electronics; carbon nanotubes; focused ion beam technology; micromechanical devices; microwave devices; nanotechnology; nanotube devices; optoelectronic devices; organic semiconductors; photodetectors; power electronics; semiconductor device models; sensors; sputter etching; thin film transistors; DRIE; MEMS; RF devices; actuators; automotive electronics; bioelectronic devices; carbon nanotubes; electron device characterization; electron device reliability; focused ion beam technology; microwave devices; molecular electronics; nanotechnology; optoelectronic devices; organic devices; organic electronic devices; photodetectors; photonic devices; photovoltaic devices; plastic microelectronics; power devices; quantum devices; semiconductor device modeling; semiconductor device simulation; semiconductor devices; sensors; thermal annealing; thin film transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices, 2005 Spanish Conference on

Conference_Location

Tarragona

Print_ISBN

0-7803-8810-0

Type

conf

DOI

10.1109/SCED.2005.1504274

Filename

1504274