• DocumentCode
    1931261
  • Title

    Parameterization of Bidirectional Reflection from Maize Leaves with Measurement in the Principal Plane

  • Author

    Lao, Cailian ; Guo, Yan ; Li, BaoGuo

  • Author_Institution
    Coll. of Inf. & Electr. Eng., China Agric. Univ., Beijing
  • fYear
    2006
  • fDate
    13-17 Nov. 2006
  • Firstpage
    109
  • Lastpage
    115
  • Abstract
    Characterization of bidirectional reflectance distribution of individual leaf is essential in canopy radiative transfer modeling. Measuring bidirectional reflection over reflectance hemisphere is a very complex and time-consuming work. Considering that leaf´s reflection is a linear combination of specular and diffuse component, where specular reflection is centered on mirror direction in the principal plane and diffuse reflection is uniform regardless of directions, we made an attempt to parameterize Bidirectional Reflectance Distribution Function (BRDF) over reflectance hemisphere from angular distribution of reflection in its principal plane. Angular reflection of maize (Zea mays L) leaves over reflectance hemisphere was measured with a custom-designed device. The leaves were illuminated with two wavelengths of 650 nm and 830 nm, at three incidence angles of 0deg, 30deg and 60deg. Reflection measured in the principal plane was used to model BRDF with a physically based BRDF model. They were used to predict the reflection in other directions outside the principal plane. The predicted reflection was in a good agreement with those measured. It indicates that reflection distribution in the principal plane carries sufficient information to characterize the BRDF over hemisphere.
  • Keywords
    agricultural engineering; computer graphics; reflection; angular distribution; bidirectional reflectance distribution function; canopy radiative transfer modeling; maize leaves angular reflection; principal plane measurement; reflectance hemisphere; specular reflection; Bidirectional control; Educational institutions; Light scattering; Optical polarization; Optical reflection; Optical scattering; Optical surface waves; Reflectivity; Surface topography; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plant Growth Modeling and Applications, 2006. PMA '06. Second International Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-0-7695-2851-9
  • Type

    conf

  • DOI
    10.1109/PMA.2006.26
  • Filename
    4548356