DocumentCode
1938053
Title
An approach to measuring power supply impedance of microprocessors
Author
Taylor, Greg ; Deutschle, Craig ; Arabi, Tawfik ; Owens, Brian
Author_Institution
Intel Corp., Hillsboro, OR, USA
fYear
2001
fDate
2001
Firstpage
211
Lastpage
214
Abstract
A technique to calculate the relative on die power supply impedance of high power CMOS integrated circuits as a function of frequency is described. This approach uses the power supply current variation that is normally present in a microprocessor to stimulate the supply network, varying the clock rate of the processor in order to obtain multiple measurements. Using this technique the power supply impedance vs. frequency of a 0.18 μm microprocessor was measured and compared to a simple lumped circuit model
Keywords
CMOS digital integrated circuits; electric impedance measurement; integrated circuit measurement; microprocessor chips; power integrated circuits; power supply circuits; 0.18 micron; die power supply impedance measurement; frequency dependence; high power CMOS integrated circuit; lumped circuit model; microprocessor; CMOS integrated circuits; Clocks; Current measurement; Current supplies; Frequency; Impedance measurement; Integrated circuit measurements; Microprocessors; Power measurement; Power supplies;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging, 2001
Conference_Location
Cambridge, MA
Print_ISBN
0-7803-7024-4
Type
conf
DOI
10.1109/EPEP.2001.967648
Filename
967648
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