• DocumentCode
    1942513
  • Title

    Packaging design support environment-a simulation system for analysis of VLSI interconnects

  • Author

    Whipple, T.D. ; Rozenblit, J.W. ; Prince, J.L. ; Palusinski, O.A.

  • Author_Institution
    VLSI Technol., Tempe, AZ, USA
  • fYear
    1990
  • fDate
    21-23 Mar 1990
  • Firstpage
    828
  • Lastpage
    831
  • Abstract
    An X-windows-based simulation environment has been developed for the prediction of electrical characteristics of integrated circuit packaging structures. This program, called packaging design support environment (PDSE), applies simulation management techniques to drive several tools that make the calculations. Two tools calculate inductance and capacitance for multiconductor, multidielectric, two-dimensional structures, with lossy dielectrics. A third tool uses these parameters to compute pulse response characteristics of multiple coupled, uniform, lossless transmission lines terminated at discrete points with R, L, and C elements. The design process in PDSE proceeds in three major phases: modeling, simulation, and evaluation. These processes are interactive and allow the designer to refine a design model, modify experiments, and apply various evaluation procedures
  • Keywords
    VLSI; circuit analysis computing; packaging; programming environments; VLSI interconnects; X-windows-based simulation environment; capacitance; inductance; lossy dielectrics; packaging design support environment; pulse response characteristics; simulation system; two-dimensional structures; Capacitance; Circuit simulation; Computational modeling; Coupling circuits; Dielectric losses; Electric variables; Environmental management; Inductance; Integrated circuit packaging; Predictive models;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computers and Communications, 1990. Conference Proceedings., Ninth Annual International Phoenix Conference on
  • Conference_Location
    Scottsdale, AZ
  • Print_ISBN
    0-8186-2030-7
  • Type

    conf

  • DOI
    10.1109/PCCC.1990.101705
  • Filename
    101705