DocumentCode

1945730

Title

Suppression of Parasitic Bipolar Effects in Soi Mosfets by Neutron Irradiation

Author

Ipri, A.C. ; Dolny, G.M. ; Vu, D.P. ; Batty, M.W.

Author_Institution

David Sarnoff Research Center, Princeton, NJ

fYear

1992

fDate

6-8 Oct. 1992

Firstpage

34

Lastpage

35

Keywords

Bipolar transistors; Breakdown voltage; Charge carrier lifetime; Degradation; Displays; Lattices; MOSFETs; Neutrons; Power supplies; Thin film devices;

fLanguage

English

Publisher

ieee

Conference_Titel

SOI Conference, 1992. IEEE International

Conference_Location

Ponte Vedra Beach, FL

ISSN

1078-621X

Print_ISBN

0-7803-7439-8

Type

conf

DOI

10.1109/SOI.1992.664781

Filename

664781