DocumentCode
1945748
Title
Effect of silver content and nickel dopant on mechanical properties of Sn-Ag-based solders
Author
Che, F.X. ; Luan, J.E. ; Baraton, Xavier
Author_Institution
STMicroelectronics, Singapore
fYear
2008
fDate
27-30 May 2008
Firstpage
485
Lastpage
490
Abstract
In this work, five solder materials of Sn-3.0Ag-0.5Cu (SAC305), Sn-2.0Ag-0.5Cu (SAC205), Sn-1.0Ag-0.5Cu (SAC105), Sn-1.0Ag-0.5Cu-0.05Ni (SAC105Ni0.05) and Sn-1.0Ag-0.5Cu-0.02Ni (SAC105M0.02) were tested using tensile loading at room temperature to investigate the Ag content and Ni dopant effect on solder mechanical properties, respectively. In addition, different testing temperature conditions including -35 deg.C, 25 deg.C, 75 deg.C and 125 deg.C were used for SAC105M0.02 solder to investigate the temperature effect on mechanical properties. Tensile test under different strain rates from 0.000011/s to 0.11/s was conducted to study the strain rate effect on material properties. Test results show that the material properties of modulus, UTS and yield stress increase with strain rate and Ag content, but decrease with temperature. The 500 ppm Ni dopant has the significant effect on material properties of Sn-Ag-based solder than 200 ppm Ni dopant. Lower modulus, yield stress and UTS, higher elongation can be achieved for SAC105M0.05 solder compared to SAC105M0.02 solder. The rate dependent and Ag content dependent material models were developed for Sn-Ag-Cu lead free solders. In addition, the temperature and rate dependent models were developed for SAC105M0.02 solder. The microstructures of different solder alloys were analyzed based on SEM images. It was found that Ag content affects the Ag3Sn intermetallic compound dispersion and Sn grain size. The microstructure of solder alloy has finely dispersed IMC and fine Sn grain size for the high Ag content solder, which make the solder exhibit high strength.
Keywords
copper alloys; crystal microstructure; doping profiles; elastic moduli; elongation; nickel alloys; scanning electron microscopy; silver alloys; solders; tensile strength; tin alloys; SEM; Sn-Ag-Cu-Ni; elongation; intermetallic compound dispersion; microstructures; modulus; nickel dopant; silver; solders; strain rate effect; temperature -35 degC; temperature 125 degC; temperature 25 degC; temperature 293 K to 298 K; temperature 75 degC; temperature effect; tensile loading; yield stress; Material properties; Materials testing; Mechanical factors; Microstructure; Nickel; Semiconductor process modeling; Silver; Temperature; Tensile strain; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-4244-2230-2
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2008.4550016
Filename
4550016
Link To Document