CREST-a current estimator for CMOS circuits

Author

Najm, F. ; Burch, R. ; Ping Yang ; Hajj, I.

Author_Institution

Coord. Sci. Lab., Illinois Univ., Urbana, IL, USA

fYear

1988

fDate

7-10 Nov. 1988

Firstpage

204

Lastpage

207

Abstract

CREST is a pattern-independent current estimation approach developed to support electromigration analysis tools. It uses the powerful, original concept of probabilistic simulation to generate accurate estimates of the expected current waveforms efficiently. The original implementation of CREST is extended to circuits containing pass transistors, reconvergent fanout, and feedback, and heuristics to simulate circuits with large reconvergent fanout or feedback blocks efficiently are provided. The results of using CREST on several real circuits are presented.<>

Keywords

CMOS integrated circuits; circuit analysis computing; digital simulation; electric current; electromigration; feedback; heuristic programming; probability; CMOS circuits; CREST; electromigration analysis tools; expected current waveforms; feedback blocks; heuristics; pass transistors; pattern-independent current estimation; probabilistic simulation; reconvergent fanout; Circuit simulation; Electromigration; Feedback circuits; Instruments; Integrated circuit reliability; Laboratories; Pattern analysis; Power generation; Probabilistic logic; Probability;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer-Aided Design, 1988. ICCAD-88. Digest of Technical Papers., IEEE International Conference on

Conference_Location

Santa Clara, CA, USA

Print_ISBN

0-8186-0869-2

Type

conf

DOI

10.1109/ICCAD.1988.122494

Filename

122494