• DocumentCode
    1947453
  • Title

    Intrinsic Gate Capacitances and Large-Signal Transient Modeling of Thin-Film Accumulation-Mode P-Channel Soi Mosfets

  • Author

    Gentinne, B. ; Flandre, D. ; Terao, A. ; Colinge, J.P.

  • Author_Institution
    Microelectronics Lab., University Catholique de Louvain, Belgium
  • fYear
    1992
  • fDate
    6-8 Oct. 1992
  • Firstpage
    52
  • Lastpage
    53
  • Keywords
    Analytical models; Capacitance measurement; MOSFETs; Microelectronics; SPICE; Semiconductor device modeling; Substrates; Thin film circuits; Threshold voltage; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference, 1992. IEEE International
  • Conference_Location
    Ponte Vedra Beach, FL
  • ISSN
    1078-621X
  • Print_ISBN
    0-7803-7439-8
  • Type

    conf

  • DOI
    10.1109/SOI.1992.664790
  • Filename
    664790
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1947453