• DocumentCode
    1950613
  • Title

    Back-bias Enhanced Source-Side Injection in 0.25um Embedded Flash Memories

  • Author

    Houdt, J. Van ; Verheyen, P. ; Frisson, J. ; Wellekens, D. ; Lorenzini, M. ; Maes, H.E.

  • Author_Institution
    IMEC, Leuven, Belgium
  • Volume
    1
  • fYear
    1999
  • fDate
    13-15 Sept. 1999
  • Firstpage
    608
  • Lastpage
    611
  • Keywords
    Channel hot electron injection; Current measurement; Flash memory; Flash memory cells; Impact ionization; Manufacturing; Secondary generated hot electron injection; Semiconductor memory; Substrate hot electron injection; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1999. Proceeding of the 29th European
  • Conference_Location
    Leuven, Belgium
  • Print_ISBN
    2-86332-245-1
  • Type

    conf

  • Filename
    1505576
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1950613