DocumentCode
1951698
Title
Distributed control in testable high-level synthesis with low area and power overhead
Author
Harmanani, Haidar ; Marrouche, Wissam
Author_Institution
Dept. of Comput. Sci., Lebanese American Univ., Byblos, Lebanon
fYear
2004
fDate
20-23 June 2004
Firstpage
65
Lastpage
68
Abstract
This work presents a method for distributed test control in coordination with testable data path allocation in high-level synthesis. The method aims at creating distributed test controllers for synthesized data paths with the aim of minimizing area and power consumption. The distributed controllers are designed to be small and mounted next to their corresponding test kernels. Thus, every test kernel in the datapath has its own test controller in addition to a relatively small controller that synchronizes the distributed controllers. The system has been implemented using C++ and favorable results are reported.
Keywords
C++ language; circuit testing; control system synthesis; distributed control; high level synthesis; power consumption; C++ language; data path allocation; distributed controller design; distributed test control; high level synthesis; power consumption; Automatic control; Built-in self-test; Circuit synthesis; Circuit testing; Clocks; Control system synthesis; Distributed control; High level synthesis; Kernel; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2004. NEWCAS 2004. The 2nd Annual IEEE Northeast Workshop on
Print_ISBN
0-7803-8322-2
Type
conf
DOI
10.1109/NEWCAS.2004.1359018
Filename
1359018
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