• DocumentCode
    1952000
  • Title

    A new 600V PT-IGBT for the improved avalanche energy by employing the floating p-well

  • Author

    Kim, Soo-Seong ; Yun, Chong-Man ; Choi, Yeam-Ik ; Han, Min-Koo

  • Author_Institution
    Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
  • fYear
    2003
  • fDate
    14-17 April 2003
  • Firstpage
    71
  • Lastpage
    74
  • Abstract
    A new IGBT employing a floating p-well, which improves the avalanche energy, is proposed and verified using the 2D numerical simulation. By implementing the floating p-well, the peak point of impact ionization moves from the surface under the gate to the bottom of the p-well so that the hole current flows vertically through the bottom of the p-well under the unclamped inductive switching (UIS). Hence, the avalanche capability can be significantly improved by the reduction of the hole current beneath the n+ emitter. Also, the saturation voltage of the proposed device can be comparable to that of the conventional device by adjusting the thickness of the n-epitaxial layer.
  • Keywords
    avalanche breakdown; circuit optimisation; impact ionisation; insulated gate bipolar transistors; semiconductor device manufacture; semiconductor quantum wells; 2D numerical simulation; 600 V; PT-IGBT; UIS; avalanche capability; avalanche energy; floating p-well; hole current; impact ionization; n+ emitter; n-epitaxial layer; peak point; punch through insulated gate bipolar transistor; saturation voltage; unclamped inductive switching; Circuits; Electric breakdown; Epitaxial layers; Frequency; Immune system; Impact ionization; Insulated gate bipolar transistors; Switched-mode power supply; Switches; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 2003. Proceedings. ISPSD '03. 2003 IEEE 15th International Symposium on
  • Print_ISBN
    0-7803-7876-8
  • Type

    conf

  • DOI
    10.1109/ISPSD.2003.1225233
  • Filename
    1225233