DocumentCode
1952475
Title
Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)
fYear
2000
fDate
20-22 March 2000
Abstract
The following topics were dealt with. DFM; design for reliability; electronic manufacturing; DSM modelling; EDA tools; low power test; IP blocks; and design quality
Keywords
design for manufacture; electronic design automation; electronic equipment manufacture; industrial property; low-power electronics; quality control; reliability; DFM; DSM modelling; EDA tools; IP blocks; design for reliability; design quality; electronic manufacturing; low power test;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2000. ISQED 2000. Proceedings. IEEE 2000 First International Symposium on
Conference_Location
San Jose, CA, USA
Print_ISBN
0-7695-0525-2
Type
conf
DOI
10.1109/ISQED.2000.838850
Filename
838850
Link To Document