• DocumentCode
    1952698
  • Title

    Measuring design quality by measuring design complexity

  • Author

    Keating, Mike

  • Author_Institution
    Synopsys Inc., USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    103
  • Lastpage
    108
  • Abstract
    Chips continue to get larger and more complex, and as they do, design quality continues to become more difficult and more important. Improving quality metrics is a key to addressing this problem, both for measuring quality and for predicting design quality early in the design cycle. This paper proposes a method of quantifying design complexity, enabling design teams to produce architectures and implementations that manage complexity, and hence quality, effectively
  • Keywords
    integrated circuit design; integrated circuit measurement; chip design; design complexity measurement; design quality measurement; Automatic testing; Chip scale packaging; Clocks; Computer bugs; Design methodology; Electronic design automation and methodology; Encapsulation; Hardware; Moore´s Law; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2000. ISQED 2000. Proceedings. IEEE 2000 First International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-0525-2
  • Type

    conf

  • DOI
    10.1109/ISQED.2000.838861
  • Filename
    838861