DocumentCode
1952698
Title
Measuring design quality by measuring design complexity
Author
Keating, Mike
Author_Institution
Synopsys Inc., USA
fYear
2000
fDate
2000
Firstpage
103
Lastpage
108
Abstract
Chips continue to get larger and more complex, and as they do, design quality continues to become more difficult and more important. Improving quality metrics is a key to addressing this problem, both for measuring quality and for predicting design quality early in the design cycle. This paper proposes a method of quantifying design complexity, enabling design teams to produce architectures and implementations that manage complexity, and hence quality, effectively
Keywords
integrated circuit design; integrated circuit measurement; chip design; design complexity measurement; design quality measurement; Automatic testing; Chip scale packaging; Clocks; Computer bugs; Design methodology; Electronic design automation and methodology; Encapsulation; Hardware; Moore´s Law; Semiconductor device measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2000. ISQED 2000. Proceedings. IEEE 2000 First International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
0-7695-0525-2
Type
conf
DOI
10.1109/ISQED.2000.838861
Filename
838861
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