• DocumentCode
    1953123
  • Title

    Delay computation in switch-level models of non-treelike MOS circuits

  • Author

    Martin, D. ; Rumin, N.C.

  • Author_Institution
    Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
  • fYear
    1988
  • fDate
    7-10 Nov. 1988
  • Firstpage
    358
  • Lastpage
    361
  • Abstract
    Various algorithmic and heuristic techniques are proposed for dealing with the problem of computing delays in switch-level models of MOS transistor circuits which contain loops. The nonlinear dependence of the effective channel resistance on the capacitive load is dealt with by adjusting the resistance within the iterative process of computing delay, using the Lin and Mead algorithm. Heuristics are proposed for reducing the number of iterations by splitting the loops at high capacitance nodes and by basing the initial values of the split capacitances on the path conductances. It is demonstrated that the decomposition of the transistor groups into bicomponents is very effective for large groups. Combinations of these techniques have been tested on a large variety of circuits, a representative subset of which is presented.<>
  • Keywords
    MOS integrated circuits; capacitance; circuit analysis computing; delays; heuristic programming; integrated logic circuits; iterative methods; logic CAD; Lin and Mead algorithm; MOS transistor circuits; bicomponents; capacitive load; delay computation; effective channel resistance; heuristic techniques; high capacitance nodes; iterative process; loop splitting; nonlinear dependence; nontreelike MOS circuits; path conductances; split capacitances; switch-level models; transistor group decomposition; Capacitance; Circuit testing; Computational modeling; Delay; Equations; Iterative algorithms; Logic; MOSFETs; Switches; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1988. ICCAD-88. Digest of Technical Papers., IEEE International Conference on
  • Conference_Location
    Santa Clara, CA, USA
  • Print_ISBN
    0-8186-0869-2
  • Type

    conf

  • DOI
    10.1109/ICCAD.1988.122528
  • Filename
    122528