Measurement of bulk and film ferroelectric materials properties at microwaves

Author

Kazmirenko, V. ; Prokopenko, Y. ; Pereverzeva, L. ; Poplavko, Y. ; Kim, B. ; Jeong, M. ; Baik, S.

Author_Institution

Nat. Tech. Univ. of Ukraine, Ukraine

Volume

2

fYear

2002

fDate

2002

Firstpage

397

Abstract

A method for measuring the microwave properties of bulk and film ferroelectric materials has been developed, using a waveguide partially filled by a sample of the material to be studied. Depending on sensitivity, either reflection in a shorted waveguide or transmission in a 2-port system can be investigated. The complex reflection coefficient, S11(f) frequency dependence or transmission coefficient S21(f) were measured by scanning with a vector network analyzer. The studied films were deposited onto dielectric substrates, and a film-on-substrate "sandwich" was arranged along the waveguide. Complex computer analysis was carried out on the experimental results to verify the theoretical calculations.

Keywords

ferrite-loaded waveguides; ferroelectric materials; ferroelectric thin films; microwave measurement; permittivity measurement; complex reflection coefficient; dielectric substrates; film-on-substrate structures; frequency dependence; material microwave properties; measurement sensitivity; microwave frequency ferroelectric bulk/film material properties measurement; sample filled waveguide; shorted waveguides; transmission coefficient; two-port systems; vector network analyzer scanning; Dielectric materials; Dielectric measurements; Ferroelectric films; Ferroelectric materials; Frequency dependence; Microwave measurements; Microwave theory and techniques; Optical films; Reflection; Waveguide components;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwaves, Radar and Wireless Communications, 2002. MIKON-2002. 14th International Conference on

Print_ISBN

83-906662-5-1

Type

conf

DOI

10.1109/MIKON.2002.1017875

Filename

1017875