• DocumentCode
    1955356
  • Title

    New CMOS shallow junction well FET structure (CMOS-SJET) for low power-supply voltage

  • Author

    Yoshimura, H. ; Matsuoka, F. ; Kakumu, M.

  • Author_Institution
    Semicond. Device Eng. Lab., Toshiba Corp., Kawasaki, Japan
  • fYear
    1992
  • fDate
    13-16 Dec. 1992
  • Firstpage
    909
  • Lastpage
    912
  • Abstract
    A novel CMOS device structure called as CMOS shallow junction well FET (CMOS-SJET) has been proposed for high speed operation at low power-supply voltage. Since well regions underneath the channel regions of both n-channel and p-channel MOSFETs in the CMOS-SJET are fully depleted, steeper subthreshold characteristics can be achieved. Furthermore, junction capacitances are reduced by half compared with those of the conventional CMOS structure. Therefore the gate delay of 52 psec/stage at 1.5 V operation and low power-delay product of 1 fJ are verified with 0.35 mu m gate length design. The CMOS-SJET structure appears to offer high performance with low power-delay product at low voltage operation.<>
  • Keywords
    CMOS integrated circuits; capacitance; delays; integrated circuit technology; large scale integration; 0.35 micron; 1.5 V; 52 ps; CMOS shallow junction well FET; LV operation; high speed operation; junction capacitances; low power-supply voltage; n-channel MOSFETs; p-channel MOSFETs; subthreshold characteristics; CMOS integrated circuits; Capacitance; Delay effects; Integrated circuit fabrication; Large-scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0817-4
  • Type

    conf

  • DOI
    10.1109/IEDM.1992.307504
  • Filename
    307504