• DocumentCode
    1956543
  • Title

    Using Trace Scratchpads to Reduce Execution Times in Predictable Real-Time Architectures

  • Author

    Whitham, Jack ; Audsley, Neil

  • Author_Institution
    Dept. of Comput. Sci., Univ. of York, York
  • fYear
    2008
  • fDate
    22-24 April 2008
  • Firstpage
    305
  • Lastpage
    316
  • Abstract
    Instruction scratchpads have been previously suggested as a way to reduce the worst case execution time (WCET) of hard real-time programs without introducing the analysis issues posed by caches. Trace scratchpads extend this paradigm with support for instruction level parallelism (ILP) while preserving simplicity of WCET analysis. In this paper, we demonstrate trace scratchpads using the MCGREP-2 CPU architecture. We provide a sample algorithm to automatically reduce the WCET of a program using a trace scratchpad, and compare the results with the use of an instruction scratchpad. We find that the two types of scratchpad are best used together. Instruction scratchpads provide excellent WCET improvements at low cost, but trace scratchpads reduce WCET further by optimizing worst case (WC) paths and exploiting ILP across basic block boundaries. Using our experimental implementation, we have observed WCET improvements over an instruction scratchpad of up to 149% with some Malardalen WCET benchmarks.
  • Keywords
    cache storage; MCGREP-2 CPU architecture; hard real-time program; instruction level parallelism; instruction scratchpad; memory architecture; predictable real-time architecture; trace scratchpad; worst case execution time; Application software; Computer aided instruction; Computer architecture; Computer science; Cost function; Lifting equipment; Optical wavelength conversion; Parallel processing; Real time systems; Timing; hard real-time; reduction; scratchpads; trace; wcet;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Real-Time and Embedded Technology and Applications Symposium, 2008. RTAS '08. IEEE
  • Conference_Location
    St. Louis, MO
  • ISSN
    1545-3421
  • Print_ISBN
    978-0-7695-3146-5
  • Type

    conf

  • DOI
    10.1109/RTAS.2008.11
  • Filename
    4550802