• DocumentCode
    1957934
  • Title

    Evalution of bulk titanium DRIE Using SU-8 as soft mask

  • Author

    Zhao, Gang ; Tian, Yao ; Shu, Qiong ; Chen, Jing

  • Author_Institution
    Nat. Key Lab. of Nano/Micro Fabrication Technol., Peking Univ., Beijing
  • fYear
    2009
  • fDate
    5-8 Jan. 2009
  • Firstpage
    514
  • Lastpage
    517
  • Abstract
    This paper reports the characterization of bulk titanium deep etching using inductively coupled chlorine plasma using SU-8 as softmask. SU-8 has many advantages over the traditional employed hardmask, such as selective stripping, cost efficiency and the ability to accommodate ultra deep etching. The effects of process parameters (ICP source power, platen power and Cl2 flow rate) on etch rate, selectivity and the etch profile were investigated. With the optimized process parameters (400 W ICP source power, 100 W platen power, 60 sccm Cl2 flow rate, 3 mT chamber pressure), an etch rate of 1.06 mum/min has been achieved with an aspect ratio of 5:1 and smooth surface. Ultra-deep titanium etching up to 200 mum has been realized with SU-8 softmask, which is among the best of the present reports.
  • Keywords
    masks; optimisation; plasma materials processing; plasma sources; sputter etching; titanium; ICP source power; SU-8 softmask; Ti; bulk titanium DRIE; cost efficiency; deep reactive ion etching; etch profile; inductively coupled chlorine plasma; optimized process parameters; power 100 W; power 400 W; ultra deep etching; Fabrication; Plasma applications; Plasma chemistry; Plasma sources; Plasma temperature; Silicon; Sputter etching; Substrates; Systems engineering and theory; Titanium; DRIE; SU-8; Titanium; profile; softmask;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2009. NEMS 2009. 4th IEEE International Conference on
  • Conference_Location
    Shenzhen
  • Print_ISBN
    978-1-4244-4629-2
  • Electronic_ISBN
    978-1-4244-4630-8
  • Type

    conf

  • DOI
    10.1109/NEMS.2009.5068631
  • Filename
    5068631