DocumentCode
1957934
Title
Evalution of bulk titanium DRIE Using SU-8 as soft mask
Author
Zhao, Gang ; Tian, Yao ; Shu, Qiong ; Chen, Jing
Author_Institution
Nat. Key Lab. of Nano/Micro Fabrication Technol., Peking Univ., Beijing
fYear
2009
fDate
5-8 Jan. 2009
Firstpage
514
Lastpage
517
Abstract
This paper reports the characterization of bulk titanium deep etching using inductively coupled chlorine plasma using SU-8 as softmask. SU-8 has many advantages over the traditional employed hardmask, such as selective stripping, cost efficiency and the ability to accommodate ultra deep etching. The effects of process parameters (ICP source power, platen power and Cl2 flow rate) on etch rate, selectivity and the etch profile were investigated. With the optimized process parameters (400 W ICP source power, 100 W platen power, 60 sccm Cl2 flow rate, 3 mT chamber pressure), an etch rate of 1.06 mum/min has been achieved with an aspect ratio of 5:1 and smooth surface. Ultra-deep titanium etching up to 200 mum has been realized with SU-8 softmask, which is among the best of the present reports.
Keywords
masks; optimisation; plasma materials processing; plasma sources; sputter etching; titanium; ICP source power; SU-8 softmask; Ti; bulk titanium DRIE; cost efficiency; deep reactive ion etching; etch profile; inductively coupled chlorine plasma; optimized process parameters; power 100 W; power 400 W; ultra deep etching; Fabrication; Plasma applications; Plasma chemistry; Plasma sources; Plasma temperature; Silicon; Sputter etching; Substrates; Systems engineering and theory; Titanium; DRIE; SU-8; Titanium; profile; softmask;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2009. NEMS 2009. 4th IEEE International Conference on
Conference_Location
Shenzhen
Print_ISBN
978-1-4244-4629-2
Electronic_ISBN
978-1-4244-4630-8
Type
conf
DOI
10.1109/NEMS.2009.5068631
Filename
5068631
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