• DocumentCode
    1957948
  • Title

    Electrical and chemical stability of polymer transistors

  • Author

    Street, R.A. ; Chabinyc, M.

  • Author_Institution
    Palo Alto Res. Center, Palo Alto
  • fYear
    2007
  • fDate
    18-20 June 2007
  • Firstpage
    21
  • Lastpage
    21
  • Abstract
    We describe the effects of both electrical stress and environmental exposure on polythiophene TFTs.The physical mechanisms of the bias stress effects, and whether they are intrinsic to the polymer semiconductor, will be discussed. We propose that molecular impurities cause an increase the local disorder and provide localized states that modify the electrical transport.
  • Keywords
    environmental factors; localised states; organic semiconductors; stability; stress effects; thin film transistors; transport processes; bias stress effects; chemical stability; electrical stability; electrical stress; electrical transport; environmental exposure; localized states; molecular impurities; physical mechanisms; polymer semiconductor; polymer transistors; polythiophene TFT; Backplanes; Chemicals; Displays; Polymer films; Solvents; Stability; Stress measurement; Thermal stresses; Thin film transistors; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2007 65th Annual
  • Conference_Location
    Notre Dame, IN
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-4244-1101-6
  • Electronic_ISBN
    1548-3770
  • Type

    conf

  • DOI
    10.1109/DRC.2007.4373632
  • Filename
    4373632
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1957948