DocumentCode
1959281
Title
Surface Examination using a Superresolution Scanning Microwave Microscope
Author
Ash, E.A. ; Husain, A.
Author_Institution
Department of Electronic and Electrical Engineering, University College, London
Volume
2
fYear
1973
fDate
4-7 Sept. 1973
Firstpage
1
Lastpage
4
Keywords
Acoustic signal detection; Apertures; Detectors; Gratings; Microscopy; Nondestructive testing; Object detection; Phase detection; Signal resolution; Surface cracks;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1973. 3rd European
Conference_Location
Brussels, Belgium
Type
conf
DOI
10.1109/EUMA.1973.331765
Filename
4130357
Link To Document