• DocumentCode
    1960536
  • Title

    Improving the robustness of a surface integral formulation for wideband impedance extraction of 3D structures

  • Author

    Zhenhai Zhu ; Jingfang Huang ; Song, B. ; White, J.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
  • fYear
    2001
  • fDate
    4-8 Nov. 2001
  • Firstpage
    592
  • Lastpage
    597
  • Abstract
    In order for parasitic extraction of high-speed integrated circuit interconnect to be sufficiently efficient, and fit with model-order reduction techniques, a robust wideband surface integral formulation is essential. One recently developed surface integral formulation has shown promise, but was plagued with numerical difficulties of poorly understood origin. We show that one of that formulation´s difficulties was related to the inaccuracy in the approach to evaluate integrals over discretization panels, and we present an accurate approach based on an adapted piecewise quadrature scheme. We also show that the condition number of the original system of integral equations can be reduced by differentiating one of the integral equations. Computational results on a ring and a spiral inductor are used to show that the new quadrature scheme and the differentiated integral formulation improve accuracy and accelerate the convergence of iterative solution methods.
  • Keywords
    circuit layout CAD; high-speed integrated circuits; inductors; integral equations; integrated circuit interconnections; integrated circuit layout; iterative methods; piecewise polynomial techniques; reduced order systems; 3D structures; adapted piecewise quadrature scheme; differentiated integral formulation; discretization panels; high-speed integrated circuit interconnect; integral equations; iterative solution methods; model-order reduction techniques; parasitic extraction; robustness; spiral inductor; surface integral formulation; wideband impedance extraction; Acceleration; High speed integrated circuits; Inductors; Integral equations; Integrated circuit interconnections; Integrated circuit modeling; Robustness; Spirals; Surface fitting; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Aided Design, 2001. ICCAD 2001. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA, USA
  • ISSN
    1092-3152
  • Print_ISBN
    0-7803-7247-6
  • Type

    conf

  • DOI
    10.1109/ICCAD.2001.968718
  • Filename
    968718