DocumentCode
1962594
Title
Automated extraction of capacitances and electrostatic forces in MEMS and ULSI interconnects from the mask layout
Author
Bachtold, M. ; Taschini, S. ; Korvink, J.G. ; Baltes, H.
Author_Institution
Phys. Electron. Lab., Eidgenossische Tech. Hochschule, Zurich, Switzerland
fYear
1997
fDate
10-10 Dec. 1997
Firstpage
129
Lastpage
132
Abstract
Efficient and accurate electrostatic simulations are required for extracting capacitance values and electrostatic forces in the design of MEMS actuators and ULSI interconnects. Typical simulations involve complex 3D geometries and various boundary conditions. The simulation of such devices involves the time-consuming and error-prone specification of the geometry, the construction of a 3D mesh suited to numerical computation, and an efficient and accurate electrostatic simulation engine. In this paper, we present a fully automated approach to electrostatic device characterization, using the mask layout and a process description as the input for the geometry definition. The presented solution allows one to perform automated electrostatic parameter extraction while requiring only minimal user interaction and also provides an estimation of the accuracy of the computed result.
Keywords
ULSI; capacitance; digital simulation; electrostatics; integrated circuit interconnections; masks; microactuators; MEMS; ULSI interconnects; actuators; automated electrostatic parameter extraction; boundary conditions; capacitance; complex 3D geometries; electrostatic forces; electrostatic simulations; geometry definition; mask layout; process description; Boundary conditions; Capacitance; Computational geometry; Computational modeling; Electrostatic actuators; Electrostatic devices; Engines; Micromechanical devices; Solid modeling; Ultra large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International
Conference_Location
Washington, DC, USA
ISSN
0163-1918
Print_ISBN
0-7803-4100-7
Type
conf
DOI
10.1109/IEDM.1997.650216
Filename
650216
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