• DocumentCode
    1963490
  • Title

    KKL, Kruskal-Katona, and Monotone Nets

  • Author

    O´Donnell, Ryan ; Wimmer, Karl

  • Author_Institution
    Comput. Sci. Dept., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2009
  • fDate
    25-27 Oct. 2009
  • Firstpage
    725
  • Lastpage
    734
  • Abstract
    We generalize the Kahn-Kalai-Linial (KKL) Theorem to random walks on Cayley and Schreier graphs, making progress on an open problem of Hoory, Linial, and Wigderson. In our generalization, the underlying group need not be abelian so long as the generating set is a union of conjugacy classes. An example corollary is that for every f : (k [n]) ¿ {0,1} with E[f] and k/n bounded away from 0 and 1, there is a pair 1 ¿ i < j ¿ n such that Zij(f) ¿ ¿(log n/n). Here lij(f) denotes the "influence" on / of swapping the ith and jth coordinates. Using this corollary we obtain a "robust" version of the Kruskal-Katona Theorem: Given a constant-density subset A of a middle slice of the Hamming n-cube, the density of ¿A is greater by at least ¿(log n/n), unless A is noticeably correlated with a single coordinate. As an application of these results, we show that the set of functions {0,1, x1,..., x¿, Maj} is a (1/2-¿)-net for the set of all n-bit monotone boolean functions, where ¿ = ¿(log n//¿(n)). This distance is optimal for polynomial-size nets and gives an optimal weak-learning algorithm for monotone functions under the uniform distribution, solving a problem of Blum, Burch and Langford.
  • Keywords
    graph theory; random functions; Cayley graphs; Hamming n-cube; Kahn-Kalai-Linial theorem; Kruskal-Katona; Schreier graphs; monotone nets; random walks; Boolean functions; Complexity theory; Computer science; Distributed computing; Polynomials; Random variables; Robustness; USA Councils; KKL; Kahn-Kalai-Linial; Kruskal-Katona; boolean functions; learning; monotone functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Foundations of Computer Science, 2009. FOCS '09. 50th Annual IEEE Symposium on
  • Conference_Location
    Atlanta, GA
  • ISSN
    0272-5428
  • Print_ISBN
    978-1-4244-5116-6
  • Type

    conf

  • DOI
    10.1109/FOCS.2009.78
  • Filename
    5438582