DocumentCode
1965659
Title
Modeling of Probabilistic Ripple-Carry Adders
Author
Lau, Mark S K ; Ling, Keck Voon ; Chu, Yun Chung ; Bhanu, Arun
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear
2010
fDate
13-15 Jan. 2010
Firstpage
201
Lastpage
206
Abstract
This paper proposes a mathematical model for probabilistic ripple-carry adders. The model gives explicit expressions for calculating error probabilities of sum and carry bits. The expressions show how errors propagate through the carry, which accumulate and eventually influence the correctness of a ripple-carry adder´s outputs. The proposed model is flexible since it only requires mild assumptions on the probability distribution of noise. Hence, in addition to Gaussian, it is applicable to a wide class of distributions. We validate the model through HSPICE simulation. The model is able to predict error-rates of a simulated probabilistic ripple-carry adder with reasonable accuracy.
Keywords
adders; integrated circuit modelling; probability; HSPICE simulation; error probability; error propagation; noise modelling; probabilistic ripple-carry adders; Adders; Birth disorders; Computational modeling; Energy consumption; Error probability; Mathematical model; Predictive models; Probability distribution; Switches; Voltage; Probabilistic computation; error propagation; noies modeling; ripple-carry adder;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Design, Test and Application, 2010. DELTA '10. Fifth IEEE International Symposium on
Conference_Location
Ho Chi Minh City
Print_ISBN
978-0-7695-3978-2
Electronic_ISBN
978-1-4244-6026-7
Type
conf
DOI
10.1109/DELTA.2010.14
Filename
5438689
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