• DocumentCode
    1965927
  • Title

    Novel growth of GaN with low dislocation density for UV lasers

  • Author

    Aoyagi, Yoshinobu ; Tanaka, Satoru ; Takeuchi, Misaichi ; Hirayama, Hideki

  • Author_Institution
    Tokyo Inst. of Technol., Japan
  • Volume
    2
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    687
  • Abstract
    For realization of UV semiconductor laser using III-nitride materials there are couple of breakthroughs to be overcome. Quantum dots formation in quasi-lattice matched system, reduction of dislocation density, formation of highly doped p-type layer and ohmic contact to the layer are typical examples. Recently we have developed couple of techniques to overcome those subjects. A typical example is a quantum dot formation on a surface of quasi-lattice matched or lattice matched substrate using atomic anti-surfactant which acts as atomic nano mask and effective reduction of dislocation density using the atomic nano mask. In this paper, recent experimental results focused on quantum dots formation in quasi-lattice matched system and effective reduction of dislocation density of GaN using the atomic nano mask on the substrate surface are reported
  • Keywords
    III-V semiconductors; atomic force microscopy; dislocation density; gallium compounds; quantum well lasers; self-assembly; semiconductor growth; semiconductor quantum dots; wide band gap semiconductors; AFM; GaN; UV semiconductor laser; atomic antisurfactant; atomic nano mask; dislocation threading; epitaxial layer; low dislocation density materials; overgrown layer; quantum dots formation; quasi-lattice matched system; step flow growth mode; surface morphology; two dimensional crystal growth mode; Atomic layer deposition; Gallium nitride; Ohmic contacts; Optical coupling; Optical materials; Quantum dot lasers; Quantum dots; Semiconductor lasers; Semiconductor materials; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society, 2001. LEOS 2001. The 14th Annual Meeting of the IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1092-8081
  • Print_ISBN
    0-7803-7105-4
  • Type

    conf

  • DOI
    10.1109/LEOS.2001.969000
  • Filename
    969000