DocumentCode
1966861
Title
Fault-tolerant wearable computing system architecture for self-health management
Author
Mitra, Reshmi ; Joshi, Bharat ; Mukherjee, Arindam
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of North Carolina at Charlotte, Charlotte, NC
fYear
2008
fDate
18-20 May 2008
Firstpage
349
Lastpage
354
Abstract
One of the most important applications of wearable computing or smart textiles is biomedical monitoring for self-health management. In this paper Constraint Satisfaction Problem (CSP) for smart textiles is defined. The goal is an optimized fault tolerant on-body sensor network. A novel event-driven architecture for smart textiles is proposed. A correlation between the architecture and the design features is established for optimized signal collection, fault tolerance and simplified interconnects. As part of the reliability analysis, this work proceeds to present the description of faults. Then a suitable fault model is defined supporting the defect distribution. Finally, the simulator based on Mealy machines was designed to correlate all the features defined during the course of work. In the end, the proposed architecture has shown significant improvement in terms of highest path reliability over a simplistic system with a single data collecting point.
Keywords
constraint theory; fault tolerance; medical computing; patient monitoring; reliability theory; textiles; wearable computers; biomedical monitoring; constraint satisfaction problem; fault tolerant on-body sensor network; fault-tolerant wearable computing system architecture; reliability analysis; self-health management; smart textiles; Biomedical monitoring; Biosensors; Computer architecture; Fault tolerance; Fault tolerant systems; Intelligent sensors; Signal design; Textiles; Wearable computers; Wearable sensors; e-textile; fault tolerance; reliability; self-health management; wearable computers;
fLanguage
English
Publisher
ieee
Conference_Titel
Electro/Information Technology, 2008. EIT 2008. IEEE International Conference on
Conference_Location
Ames, IA
Print_ISBN
978-1-4244-2029-2
Electronic_ISBN
978-1-4244-2030-8
Type
conf
DOI
10.1109/EIT.2008.4554327
Filename
4554327
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