• DocumentCode
    1966861
  • Title

    Fault-tolerant wearable computing system architecture for self-health management

  • Author

    Mitra, Reshmi ; Joshi, Bharat ; Mukherjee, Arindam

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of North Carolina at Charlotte, Charlotte, NC
  • fYear
    2008
  • fDate
    18-20 May 2008
  • Firstpage
    349
  • Lastpage
    354
  • Abstract
    One of the most important applications of wearable computing or smart textiles is biomedical monitoring for self-health management. In this paper Constraint Satisfaction Problem (CSP) for smart textiles is defined. The goal is an optimized fault tolerant on-body sensor network. A novel event-driven architecture for smart textiles is proposed. A correlation between the architecture and the design features is established for optimized signal collection, fault tolerance and simplified interconnects. As part of the reliability analysis, this work proceeds to present the description of faults. Then a suitable fault model is defined supporting the defect distribution. Finally, the simulator based on Mealy machines was designed to correlate all the features defined during the course of work. In the end, the proposed architecture has shown significant improvement in terms of highest path reliability over a simplistic system with a single data collecting point.
  • Keywords
    constraint theory; fault tolerance; medical computing; patient monitoring; reliability theory; textiles; wearable computers; biomedical monitoring; constraint satisfaction problem; fault tolerant on-body sensor network; fault-tolerant wearable computing system architecture; reliability analysis; self-health management; smart textiles; Biomedical monitoring; Biosensors; Computer architecture; Fault tolerance; Fault tolerant systems; Intelligent sensors; Signal design; Textiles; Wearable computers; Wearable sensors; e-textile; fault tolerance; reliability; self-health management; wearable computers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electro/Information Technology, 2008. EIT 2008. IEEE International Conference on
  • Conference_Location
    Ames, IA
  • Print_ISBN
    978-1-4244-2029-2
  • Electronic_ISBN
    978-1-4244-2030-8
  • Type

    conf

  • DOI
    10.1109/EIT.2008.4554327
  • Filename
    4554327