DocumentCode
1967224
Title
A scalable 32 Gb/s parallel data transceiver with on-chip timing calibration circuits
Author
Yang, K. ; Lin, T. ; Ke, Y.
Author_Institution
HotRail Inc., San Jose, CA, USA
fYear
2000
fDate
9-9 Feb. 2000
Firstpage
258
Lastpage
259
Abstract
Inter-chip interconnect has become increasingly important due to the recent rapid development of switch fabric data network and symmetric multi-processing (SMP) server technologies. A high-speed parallel data transceiver megacell has low power, latency, and pin count for point-to-point interconnect between chips. Each macro includes a transmitter and a receiver. The aggregate bandwidth is 32 Gb/s, or 16 Gb/s in each direction. An on-chip timing calibration circuit performs data de-skewing and timing optimization. A transport layer handles error correction through the link. Low swing differential signaling further reduces noise and error probability, and therefore relaxes restrictions of board design. The entire macro is portable and scalable, and can be integrated with standard logic process. It also works well with standard packages such as EGA or QFP. Built-in self test (BIST) logic is implemented for product testing.
Keywords
calibration; timing circuits; transceivers; 32 Gbit/s; data de-skewing; differential signaling; error correction; high-speed parallel data transceiver; inter-chip interconnect; on-chip timing calibration circuit; scalable macro; switch fabric data network; symmetric multi-processing server; timing optimization; transport layer; Automatic testing; Delay; Fabrics; Integrated circuit interconnections; Logic testing; Network servers; Switches; Timing; Transceivers; Transmitters;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2000. Digest of Technical Papers. ISSCC. 2000 IEEE International
Conference_Location
San Francisco, CA, USA
ISSN
0193-6530
Print_ISBN
0-7803-5853-8
Type
conf
DOI
10.1109/ISSCC.2000.839775
Filename
839775
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