Evaluation of Soft Errors in DRAM and SRAM using Nuclear Microprobe and Neutron Source

Author

Takay, M. ; Arita, Y. ; Abo, S. ; Iwamatsu, T. ; Maegawa, S. ; Sayama, H. ; Yamaguchi, Y. ; Inuishi, M. ; Nishimura, T.

Author_Institution

Osaka University, Japan

fYear

2001

fDate

11-13 September 2001

Firstpage

Lastpage

Keywords

Neutrons; Random access memory;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 2001. Proceeding of the 31st European

Print_ISBN

2-914601-01-8

Type

DOI

10.1109/ESSDERC.2001.195199

Filename

1506581

Link To Document