• DocumentCode
    1970272
  • Title

    Power and delay reduction via simultaneous logic and placement optimization in FPGAs

  • Author

    Kumthekar, Balakrishna ; Somenzi, Fabio

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    202
  • Lastpage
    207
  • Abstract
    Traditional FPGA design flows have treated logic synthesis and physical design as separate steps. With the recent advances in technology the lack of information on the physical implementation during logic synthesis has caused mismatches between the final circuit characteristics (delay, power and area) and those predicted by logic synthesis. In this paper, we present a technique that tightly links the logic and physical domains-we combine logic and placement optimization in a single step. The combined algorithm is based on simulation annealing and hence, very amenable to new optimization goals or constraints. Two types of moves, directed towards global reduction in the cost function (linear congestion), are accepted by the simulated annealing algorithm: (1) logic optimization steps consisting of removing or replacing redundant wires in a circuit using functional flexibilities derived from SPFDs and (2) the placement optimization steps consisting of swapping a pair of blocks in the FPGA. Feedback from placement is very valuable in making an informed choice of a target wire during logic optimization moves. Experimental results demonstrate the efficacy of our approach over the placement independent approach
  • Keywords
    circuit optimisation; delays; field programmable gate arrays; integrated circuit layout; logic CAD; simulated annealing; FPGA design; cost function; delay reduction; linear congestion; power reduction; redundant wires; simulation annealing; simultaneous logic/placement optimization; Circuit simulation; Circuit synthesis; Constraint optimization; Cost function; Delay; Field programmable gate arrays; Logic circuits; Logic design; Simulated annealing; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings
  • Conference_Location
    Paris
  • Print_ISBN
    0-7695-0537-6
  • Type

    conf

  • DOI
    10.1109/DATE.2000.840039
  • Filename
    840039