• DocumentCode
    1970491
  • Title

    Thermal Robustness of Silicon-on-Insulator Versus Bulk Material in L-Band RF Power LDMOSFETs

  • Author

    McShane, Erik A. ; Shenai, Krishna

  • Author_Institution
    University of Illinois, Chicago, USA
  • fYear
    2001
  • fDate
    11-13 September 2001
  • Firstpage
    167
  • Lastpage
    170
  • Keywords
    Electrodes; Finite element methods; Implants; L-band; Numerical simulation; Radio frequency; Robustness; Silicon on insulator technology; Temperature; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2001. Proceeding of the 31st European
  • Print_ISBN
    2-914601-01-8
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2001.195227
  • Filename
    1506609
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1970491