DocumentCode
1970503
Title
WindoWorks: a flexible program for computerized testing of accelerator control system electronic circuit boards
Author
Utterback, Jeff
Author_Institution
Fermi Nat. Accel. Lab., Batavia, IL, USA
fYear
1993
fDate
17-20 May 1993
Firstpage
1931
Abstract
Since most accelerator control system circuit boards reside in a commercial bus architecture, such as CAMAC or VMEbus, a computerized test station is needed for exercising the boards. This test station is needed for the development of newly designed prototypes, for commissioning newly manufactured boards, for diagnosing boards which have failed in service, and for long term testing of boards with intermittent failure problems. WindoWorks was created to address these needs. It is a flexible program which runs on a PC compatible computer and uses a PC to bus crate interface. WindoWorks was designed to give the user a flexible way to test circuit boards. Each test is incapsulated into a window. By bringing up several different windows the user can run several different tests simultaneously. The windows are sizable, and moveable. They have data entry boxes so that the test can be customized to the users preference. The windows can be used in conjunction with each other in order to create supertests. There are several windows which are generic. They can be used to test basic functions on any VME (or CAMAC) board. There are other windows which have been created to test specific boards. New windows for testing specific boards can be easily created by a Pascal programmer using the WindoWorks framework
Keywords
CAMAC; physical instrumentation control; physics computing; system buses; CAMAC; PC compatible computer; Pascal program; VMEbus; WindoWorks; accelerator control system electronic circuit board; bus crate interface; commercial bus architecture; computerized testing; diagnosing boards; intermittent failure problems; supertests; CAMAC; Circuit testing; Computer architecture; Computer interfaces; Control systems; Flexible printed circuits; Life estimation; Manufacturing; Prototypes; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 1993., Proceedings of the 1993
Conference_Location
Washington, DC
Print_ISBN
0-7803-1203-1
Type
conf
DOI
10.1109/PAC.1993.309181
Filename
309181
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