• DocumentCode
    1970655
  • Title

    Stochastic modeling and performance evaluation for digital clock and data recovery circuits

  • Author

    Demir, Alper ; Feldmann, Peter

  • Author_Institution
    Bell Labs., Murray Hill, NJ, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    340
  • Lastpage
    344
  • Abstract
    Clock and data recovery circuits are essential components in communication systems. They directly influence the bit-error-rate performance of communication links. It is desirable to predict the rate of occasional detection errors and the loss of synchronization due to the non-ideal operation of such circuits. In high-speed data networks, the bit-error-rate specification on the system can be very stringent, i.e., 10-14. It is not feasible to predict such error rates with straightforward, simulation based, approaches. This work introduces a stochastic model and an efficient, analysis-based, non-Monte-Carlo method for performance evaluation of digital data and clock recovery circuits. The analyzed circuit is modeled as finite state machines with inputs described as functions on a Markov chain state-space. System performance measures, such as probability of bit errors and rate of synchronization loss, can be evaluated through the analysis of a larger resulting Markov system. A dedicated multi-grid method is used to solve the very large associated linear systems. The method is illustrated on a real industrial clock-recovery circuit design
  • Keywords
    Markov processes; circuit simulation; differential equations; digital phase locked loops; finite state machines; state-space methods; synchronisation; Markov chain state-space; associated linear systems; bit errors; bit-error-rate performance; bit-error-rate specification; clock recovery circuits; data recovery circuits; dedicated multi-grid method; finite state machines; non-Monte-Carlo method; non-ideal operation; occasional detection errors; performance evaluation; rate of synchronization loss; stochastic model; stochastic modeling; synchronization; Automata; Circuit analysis; Circuit simulation; Clocks; Error analysis; Performance analysis; Predictive models; Stochastic processes; Synchronization; System performance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings
  • Conference_Location
    Paris
  • Print_ISBN
    0-7695-0537-6
  • Type

    conf

  • DOI
    10.1109/DATE.2000.840293
  • Filename
    840293