DocumentCode
1970655
Title
Stochastic modeling and performance evaluation for digital clock and data recovery circuits
Author
Demir, Alper ; Feldmann, Peter
Author_Institution
Bell Labs., Murray Hill, NJ, USA
fYear
2000
fDate
2000
Firstpage
340
Lastpage
344
Abstract
Clock and data recovery circuits are essential components in communication systems. They directly influence the bit-error-rate performance of communication links. It is desirable to predict the rate of occasional detection errors and the loss of synchronization due to the non-ideal operation of such circuits. In high-speed data networks, the bit-error-rate specification on the system can be very stringent, i.e., 10-14. It is not feasible to predict such error rates with straightforward, simulation based, approaches. This work introduces a stochastic model and an efficient, analysis-based, non-Monte-Carlo method for performance evaluation of digital data and clock recovery circuits. The analyzed circuit is modeled as finite state machines with inputs described as functions on a Markov chain state-space. System performance measures, such as probability of bit errors and rate of synchronization loss, can be evaluated through the analysis of a larger resulting Markov system. A dedicated multi-grid method is used to solve the very large associated linear systems. The method is illustrated on a real industrial clock-recovery circuit design
Keywords
Markov processes; circuit simulation; differential equations; digital phase locked loops; finite state machines; state-space methods; synchronisation; Markov chain state-space; associated linear systems; bit errors; bit-error-rate performance; bit-error-rate specification; clock recovery circuits; data recovery circuits; dedicated multi-grid method; finite state machines; non-Monte-Carlo method; non-ideal operation; occasional detection errors; performance evaluation; rate of synchronization loss; stochastic model; stochastic modeling; synchronization; Automata; Circuit analysis; Circuit simulation; Clocks; Error analysis; Performance analysis; Predictive models; Stochastic processes; Synchronization; System performance;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings
Conference_Location
Paris
Print_ISBN
0-7695-0537-6
Type
conf
DOI
10.1109/DATE.2000.840293
Filename
840293
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