• DocumentCode
    1971133
  • Title

    Study of Degradation in Channel Initiated Secondary Electron Injection Regime

  • Author

    Mohapatra, Nihar R. ; Mahapatra, S. ; Rao, V. Ramgopal

  • Author_Institution
    Indian Institute of Technology, Bombay, India
  • fYear
    2001
  • fDate
    11-13 September 2001
  • Firstpage
    291
  • Lastpage
    294
  • Keywords
    Channel hot electron injection; Charge measurement; Charge pumps; Current measurement; Degradation; Hot carriers; MOSFETs; Nonvolatile memory; Stress measurement; Substrate hot electron injection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2001. Proceeding of the 31st European
  • Print_ISBN
    2-914601-01-8
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2001.195258
  • Filename
    1506640
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1971133