• DocumentCode
    1974185
  • Title

    High sensitivity beam intensity and profile monitors for the SPS extracted beams

  • Author

    Camas, J. ; Ferioli, G. ; Jung, R. ; Mann, J.

  • Author_Institution
    CERN, Geneva, Switzerland
  • fYear
    1993
  • fDate
    17-20 May 1993
  • Firstpage
    2498
  • Abstract
    Secondary emission monitors using caesium iodide coated thin aluminium foils have been installed in the SPS transfer channels to monitor the intensity of the extracted heavy ion beams. Tests have shown an increase by a factor twenty of their sensitivity with respect to bare aluminium foils. Luminescent screens viewed with TV cameras are used to monitor the position and the profiles of the extracted beams. Various luminescent screen materials have been tested. Results on chromium doped alumina, thallium doped caesium iodide and quartz are reported. A dynamic range of 103 in beam intensities can be achieved by using these three materials in turn in the usual three screen tanks. Intensifiers used together with CCD cameras and video frame grabbers with incorporated projection calculations are used in conjunction with these screens. Results with heavy ions in the transfer channels and with protons extracted from circulating beams in the SPS are given. Detection sensitivities down to a few tens of protons per video frame have been observed
  • Keywords
    CCD image sensors; beam handling techniques; intensity measurement; particle beam diagnostics; position measurement; proton accelerators; secondary ion emission; storage rings; synchrotrons; Al2O3:Cr; CCD cameras; CsI-Al; CsI:Tl; SPS extracted beams; SPS transfer channels; SiO2:Tl; TV cameras; detection sensitivities; dynamic range; heavy ion beams; high sensitivity beam intensity monitors; luminescent screens; position monitor; profile monitors; projection calculations; protons; screen tanks; secondary emission monitors; video frame grabbers; Aluminum; Cameras; Charge coupled devices; Charge-coupled image sensors; Chromium; Dynamic range; Ion beams; Materials testing; Protons; TV;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 1993., Proceedings of the 1993
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-1203-1
  • Type

    conf

  • DOI
    10.1109/PAC.1993.309368
  • Filename
    309368