DocumentCode
1974186
Title
Research on the behavior of Se-Te film in photoelectrical field
Author
Shi, Xiao-Dong
Author_Institution
Shanghai Electr. Cable Res. Inst., China
fYear
1989
fDate
1-5 Oct. 1989
Firstpage
2282
Abstract
Se-Te films with various ratios of Se and Te were prepared, and film aging with multiple charging-discharging cycles was studied. The effects of the film composition and the wavelength of the light on the electrophotographic sensitivity were observed. Film surface properties, investigated by Auger photoelectrical energy spectrometry, are discussed. The ratio Se:Te=0.48:0.52 by weight was found to be the best ratio for film sensitivity, and 700 nm was the most suitable wavelength.<>
Keywords
ageing; electrophotography; selenium; tellurium; Auger photoelectrical energy spectrometry; Se-Te films; charging-discharging cycles; electrophotographic sensitivity; film aging; film surface properties; Aging; Chemicals; Corona; Crystalline materials; Photoconducting materials; Physics; Production; Raw materials; Spectroscopy; Tellurium;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Society Annual Meeting, 1989., Conference Record of the 1989 IEEE
Conference_Location
San Diego, CA, USA
Type
conf
DOI
10.1109/IAS.1989.96959
Filename
96959
Link To Document