• DocumentCode
    1976553
  • Title

    Robust diagnosis of nonlinear systems with structured uncertainties via the T-S fuzzy UIFDO

  • Author

    Shing, Chong-Cheng ; Hsu, Pau-Lo

  • Author_Institution
    Inst. of Electr. & Control Eng., Nat. Chiao-Tung Univ., Hsinchu
  • fYear
    2005
  • fDate
    28-31 Aug. 2005
  • Firstpage
    471
  • Lastpage
    476
  • Abstract
    For linear systems with structured uncertainties, the unknown input fault detection observer (UIFDO) provides a robust diagnostic approach by decoupling the fault signals from the unknown input term. However, in real applications, detection performance of the UIFDO degrades seriously as nonlinearities become significant in a wide dynamic operating range. In this paper, a novel UIFDO design and the Takagi-Sugeno (T-S) fuzzy model are combined to provide a T-S fuzzy UIFDO which effectively deals with nonlinear fault detection problems under structured uncertainties and input disturbance. Moreover, by applying the linear matrix inequality (LMT) technique, linear observer gains for each rule of the T-S fuzzy UIFDO can be obtained to guarantee the global stability of the system. Finally, a nonlinear benchmark example is provided to illustrate the proposed design procedures
  • Keywords
    control nonlinearities; control system synthesis; fault diagnosis; fuzzy control; fuzzy set theory; linear matrix inequalities; linear systems; nonlinear systems; observers; robust control; T-S fuzzy UIFDO; Takagi-Sugeno fuzzy model; UIFDO design; fault signal decoupling; global stability; input disturbance; linear matrix inequality; linear system; nonlinear fault detection problem; nonlinear system; robust diagnosis; structured uncertainty; unknown input fault detection observer; Degradation; Dynamic range; Fault detection; Fuzzy systems; Linear matrix inequalities; Linear systems; Nonlinear systems; Robustness; Takagi-Sugeno model; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control Applications, 2005. CCA 2005. Proceedings of 2005 IEEE Conference on
  • Conference_Location
    Toronto, Ont.
  • Print_ISBN
    0-7803-9354-6
  • Type

    conf

  • DOI
    10.1109/CCA.2005.1507170
  • Filename
    1507170