• DocumentCode
    1978743
  • Title

    An incremental ADC sensor interface with input switch-Less integrator featuring 220-nVrms resolution with ±30-mV input range

  • Author

    Bonizzoni, Edoardo ; Perez, Aldo Peña ; Caracciolo, Hervé ; Stoppa, David ; Maloberti, Franco

  • Author_Institution
    Dipt. di Ing. Ind. e dell´´Inf., Univ. of Pavia, Pavia, Italy
  • fYear
    2012
  • fDate
    17-21 Sept. 2012
  • Firstpage
    389
  • Lastpage
    392
  • Abstract
    An incremental ADC for Wheatstone CMOS stress sensor systems is described. A switched-capacitors integrator without switches toward virtual ground avoids spur signals, clock feed-through, residual offset and glitches. The circuit, fabricated in a 0.35-μm CMOS technology, consumes 42 μW at 500-kHz clock and 2.8-V supply. Low speed chopping cancels offset and limits the 1/f noise contribution. The signal-to-noise ratio with measures lasting 220 periods is 114 dB at ±100 mV full-scale range. The active area is 0.32 mm2.
  • Keywords
    1/f noise; analogue-digital conversion; integrating circuits; low-power electronics; sensors; switched capacitor networks; 1/f noise contribution; Wheatstone CMOS stress sensor system; frequency 500 kHz; incremental ADC sensor interface; input switch-less integrator; power 42 muW; signal-to-noise ratio; size 0.35 mum; switched-capacitors integrator; virtual ground; voltage 2.8 V; Capacitance; Capacitors; Clocks; Signal to noise ratio; Switches; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ESSCIRC (ESSCIRC), 2012 Proceedings of the
  • Conference_Location
    Bordeaux
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4673-2212-6
  • Electronic_ISBN
    1930-8833
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2012.6341276
  • Filename
    6341276