• DocumentCode
    1978762
  • Title

    Explicit model for tunneling and thermionic current in Schottky barrier Double-Gate MOSFETs

  • Author

    Schwarz, Mike ; Holtij, Thomas ; Kloes, Alexander ; Iñíguez, Benjamín

  • Author_Institution
    Competence Center for Nanotechnol. & Photonics, Tech. Hochschule Mittelhessen, Giessen, Germany
  • fYear
    2012
  • fDate
    6-7 March 2012
  • Firstpage
    133
  • Lastpage
    136
  • Abstract
    In this paper we present a new approach to calculate the tunneling and thermionic current in Schottky barrier Double-Gate MOSFETs (SB-DG-MOSFETs). This prediction is based on a physics-based two-dimensional analysis. Analytical approximations for the spatial tunneling current density and carrier distributions in the channel are introduced. From this explicit analytical model equations for the tunneling current are derived in closed-form which inherently include two-dimensional effects on the tunneling probability and the carrier distributions. Furthermore, an explicit analytical model equation for the thermionic current is derived. Comparison of the current with an already existing analytical numerical model and TCAD simulation data are in a good agreement for channel lengths down to 22nm.
  • Keywords
    MOSFET; current density; numerical analysis; tunnelling; SB-DG-MOSFET; Schottky barrier double-gate MOSFET; TCAD simulation data; analytical numerical model; carrier distributions; explicit analytical model equations; physics-based two-dimensional analysis; size 22 nm; spatial tunneling current density; thermionic current; tunneling current; tunneling probability; two-dimensional effects; Analytical models; Approximation methods; Current density; Equations; Logic gates; Mathematical model; Tunneling; 2D Poisson; Double-Gate (DG) MOSFET; Schottky barrier; closed-form equation; compact modeling; physics-based current model; thermionic current; tunneling current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultimate Integration on Silicon (ULIS), 2012 13th International Conference on
  • Conference_Location
    Grenoble
  • Print_ISBN
    978-1-4673-0191-6
  • Electronic_ISBN
    978-1-4673-0190-9
  • Type

    conf

  • DOI
    10.1109/ULIS.2012.6193375
  • Filename
    6193375