• DocumentCode
    1981342
  • Title

    Performance of Electrodeposited Pt/InP Schottky Diode as a Hydrogen Sensing Head for InP-Based Wireless Sensor Chips

  • Author

    Kimura, Takeshi ; Hasegawa, Hideki ; Sato, Taketomo ; Hashizume, Tamotsu

  • Author_Institution
    Res. Center for Integrated Quantum Electron., Hokkaido Univ., Sapporo
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    442
  • Lastpage
    445
  • Abstract
    Hydrogen-sensing performances of Pt/InP Schottky diodes and MESFETs are evaluated from a viewpoint of constructing a nanometer-scale hydrogen sensor head of a future wireless hydrogen sensor chip. To realize large Schottky barrier heights (SBHs), Pt films were deposited by a pulsed in-situ electrochemical process. Upon exposure to hydrogen in air, the Pt/InP Schottky diode exhibited remarkably large increase of forward and reverse currents. The sensing mechanism is explained in terms of SBH changes caused by interface dipole formed at Pt/InP interface due to the adsorbed atomic hydrogen. Quantitative relationships between response magnitude and speed have been established. The Pt/InP MESFET also showed hydrogen induced current changes, and their magnitudes were much larger than those of the Schottky diode. Based on these, a novel structure of a nanometer-scale hexagonal hydrogen sensing head is proposed
  • Keywords
    Schottky diodes; Schottky gate field effect transistors; electrochemical sensors; electrodeposition; hydrogen; indium compounds; platinum; H2; InP-based wireless sensor chips; MESFET; Pt-InP; Pt/InP Schottky diode; Schottky barrier heights; electrochemical process; electrodeposition; hydrogen sensing; Electrochemical processes; Epitaxial layers; Hydrogen; Indium phosphide; MESFETs; Performance evaluation; Schottky barriers; Schottky diodes; Substrates; Wireless sensor networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials Conference Proceedings, 2006 International Conference on
  • Conference_Location
    Princeton, NJ
  • Print_ISBN
    0-7803-9558-1
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2006.1634212
  • Filename
    1634212