• DocumentCode
    1984389
  • Title

    A high-voltage-enabled recycling folded cascode OpAmp for nanoscale CMOS technologies

  • Author

    Liu, Miao ; Mak, Pui-In ; Yan, Zushu ; Martins, R.P.

  • Author_Institution
    State Key Lab. of Analog & Mixed-Signal VLSI, Univ. of Macau, Macao, China
  • fYear
    2011
  • fDate
    15-18 May 2011
  • Firstpage
    33
  • Lastpage
    36
  • Abstract
    This paper describes a high-voltage-enabling circuit technique for enhancing the gain precision and linearity of OpAmp-based analog circuits. Without resorting from specialized devices, a 2xVDD-enabled recycling folded cascode (RFC) OpAmp optimized in IV GP 65-nm CMOS achieves, when compared with its 1xVDD counterpart, 25-dB higher open-loop DC gain and 30-dB higher IM3 (in closed loop), under a similar power budget. These joint improvements save the need of a 2nd stage in the OpAmp when high precision and high linearity are the priorities. A voltage-conscious bias scheme and gate-drain-source engineering ensure that all devices are consistently operated within the reliability limits.
  • Keywords
    CMOS analogue integrated circuits; operational amplifiers; power integrated circuits; IM3; gate-drain-source engineering; high-voltage-enabled recycling folded cascode opamp-based analog circuit; nanoscale GP CMOS technology; open-loop DC gain; power budget; size 65 nm; voltage 1 V; voltage-conscious bias scheme; CMOS integrated circuits; Gain; Integrated circuit reliability; Logic gates; MOS devices; Reliability engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
  • Conference_Location
    Rio de Janeiro
  • ISSN
    0271-4302
  • Print_ISBN
    978-1-4244-9473-6
  • Electronic_ISBN
    0271-4302
  • Type

    conf

  • DOI
    10.1109/ISCAS.2011.5937494
  • Filename
    5937494