DocumentCode
1985430
Title
Minimal hardware multiple signature analysis for BIST
Author
Yuejian Wu ; Ivanov, A.
Author_Institution
Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
fYear
1993
fDate
6-8 April 1993
Firstpage
17
Lastpage
20
Abstract
Proposes a new BIST multiple intermediate signature analysis scheme which checks n signatures against a single reference. Therefore, the circuitry for checking n signatures is essentially the same as that for checking one signature. The scheme is based on a manipulation of the CUT´s fault-free output sequence. No circuit modification is required. The cost for implementing the scheme is a small nonrecurring CPU time expenditure in the design phase. In return, the scheme yields significant recurring silicon area savings, and reduced aliasing.<>
Keywords
built-in self test; integrated logic circuits; logic testing; BIST multiple intermediate signature analysis; aliasing; fault-free output sequence; nonrecurring CPU time expenditure; recurring silicon area savings; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Compaction; Costs; Fault diagnosis; Hardware; Random number generation; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
Conference_Location
Atlantic City, NJ, USA
Print_ISBN
0-8186-3830-3
Type
conf
DOI
10.1109/VTEST.1993.313314
Filename
313314
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