• DocumentCode
    1985430
  • Title

    Minimal hardware multiple signature analysis for BIST

  • Author

    Yuejian Wu ; Ivanov, A.

  • Author_Institution
    Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
  • fYear
    1993
  • fDate
    6-8 April 1993
  • Firstpage
    17
  • Lastpage
    20
  • Abstract
    Proposes a new BIST multiple intermediate signature analysis scheme which checks n signatures against a single reference. Therefore, the circuitry for checking n signatures is essentially the same as that for checking one signature. The scheme is based on a manipulation of the CUT´s fault-free output sequence. No circuit modification is required. The cost for implementing the scheme is a small nonrecurring CPU time expenditure in the design phase. In return, the scheme yields significant recurring silicon area savings, and reduced aliasing.<>
  • Keywords
    built-in self test; integrated logic circuits; logic testing; BIST multiple intermediate signature analysis; aliasing; fault-free output sequence; nonrecurring CPU time expenditure; recurring silicon area savings; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Compaction; Costs; Fault diagnosis; Hardware; Random number generation; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
  • Conference_Location
    Atlantic City, NJ, USA
  • Print_ISBN
    0-8186-3830-3
  • Type

    conf

  • DOI
    10.1109/VTEST.1993.313314
  • Filename
    313314